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Signal processing for semiconductor detectors. IEEE Trans. Nucl. Sci. NS-29/3 (1982) 1125–1141 Grupen, C. (1996). Particle Detectors. Cambridge University Press, Cambridge. G6G78 Holland, S. and Spieler, H. (1990). A monolithically integrated detector–preamplifier on high-resistivity silicon. IEEE Trans. Nucl. Sci. NS-37 (1990) 463–468 Holland, S. (1992). Properties of CMOS Devices and circuits fabricated on highresistivity, detector-grade Silicon. IEEE Trans. Nucl. Sci. NS-39/4 (1992) 809–813 Kemmer, J.

27. Typical detector front-end circuit. signal-to-noise ratio while limiting the duration of the signal pulse to accommodate the signal pulse rate. Even if not explicitly stated, all amplifiers provide some form of pulse shaping, due to their limited frequency response. 28) includes both current and voltage noise sources. The leakage current of a semiconductor detector, for example, fluctuates due to electron emission statistics. This “shot noise” ind is represented by a current noise generator in parallel with the detector.

To provide this interface the readout ICs are mounted on a substrate, which accommodates the signal bussing between ICs, control signals, and power supply busses. SUBSYSTEMS 39 Important components are bypass capacitors and filter networks to block external interference from the readout ICs, but also to keep digital switching spikes from propagating through the power supply lines. 32 shows an assembly of multiple detectors with readout circuitry, mounted on a stave that also integrates the data and power busses.

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